From: Meitian Wang
Date: 6 June 2012 20:26
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SYNCHROTRON BEAM TIME FOR MACROMOLECULAR CRYSTALLOGRAPHY AT SLS
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Proposal application deadline: Friday, June 15, 2012
Periods:
September 1, 2012 - December 31, 2012 (Normal / Test proposals)
September 1, 2012 - August 31, 2014 (Long-term proposals)
Proposal submission:
Travel support:
PSI DUO application for iphone:
What's New?
- PILATUS detectors at three PX beamlines
- X06DA Multi-axis goniometer (PRIGO)
- X06DA In-situ X-ray diffraction screening for any SBS format plate
- X10SA Single crystal spectroscopy (UV-Vis, fluorescence and Raman), but no open call for this period (see details below).
X06SA Beamline features (http://www.psi.ch/sls/pxi/pxi)
- Undulator beamline with flux of 2x10^12 photons/sec at 12.4 keV (1Å) and fully tunable from 6.0 to 17.5 keV (2.07 - 0.71 Å)
- Focused beam size and divergency: HRD - 85x10 microns and 0.35x0.06 mrad; MD2 - 25x5 microns and 0.5x0.4 mrad
- PILATUS 6M pixel detector at the High Resolution Diffractometer, allowing continuous, fine phi-sliced data acquisition (25 frames per second) with 20 bit dynamic range (see http://pilatus.web.psi.ch/ or www.dectris.com for further information)
- MAR225 CCD at Micro-Diffractometer MD2, allowing data collection with a focussed beam size of 25 x 5 micrometers, and smaller beam size with triple-aperture assembly ( 5 x 5, 10 x 10, 20 x 20 micrometer).
X06DA Beamline features (http://www.psi.ch/sls/pxiii/pxiii)
- Super-bending magnet beamline with flux of 5x10¹¹ photons/sec at 12.4 keV (1Å) and fully tunable from 6.0 to 17.5 keV (2.07 - 0.71 Å)
- Focused beam size and divergency: 80x45 microns and 2x0.5 mrad (with possibility to reduce horizontal divergency to 0.4 mrad)
- Mini-hutch design for fast manual mounting
- PILATUS 2M (60 Hz, 450 um Si sensor)
- Multi-axis goniometer (PRIGO) for crystal re-orentation
- In-situ X-ray diffraction screening (with any SBS format plate) available during users shifts (R. Bingel-Erlenmeyer, et al., Crystal Growth & Design 2011, 11, 916)
X10SA Beamline features (http://www.psi.ch/sls/pxii/pxii)
- Undulator beamline with flux of 2x10^12 photons/sec at 12.4 keV (1Å) and fully tunable from 6.0 to 20 keV (2.07 - 0.62 Å)
- Focused beam size and divergency: 50x10 microns and 0.6x0.1 mrad
- In-situ on-axis single crystal UV-Vis, fluorescence, Raman and Resonance Raman microspectrophotometer (http://www.psi.ch/sls/pxii/spectrolab)
- PILATUS 6M pixel detector
Note: beamtime for single crystal spectroscopy is very limited in this call period due to a scheduled diffractometer upgrade.
Best regards,
The MX group at SLS
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Meitian Wang
Swiss Light Source at Paul Scherrer Institut
CH-5232 Villigen PSI - http://www.psi.ch/sls/
CH-5232 Villigen PSI - http://www.psi.ch/sls/
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