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SYNCHROTRON BEAM TIME FOR MACROMOLECULAR CRYSTALLOGRAPHY AT SLS
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Proposal application deadline: Saturday, October 15, 2011
Periods:
January 1, 2012 - Apri 30, 2012 (Normal / Test proposals)
January 1, 2012 - December 31, 2013 (Long-term proposals)
Proposal submission:
Travel support:
PSI DUO application for iphone:
What's New?
- X06SA High-resolution diffractometer: PILATUS detector runs two times faster (25 Hz)
- X06SA Micro-diffractometer: Triple aperture (5, 10, and 20 microns) with one mouse click exchange
- X06DA New PILATUS 2M (60 Hz) in Nov. 2011
- X06DA In-situ X-ray diffraction screening for any SBS format plate
- X10SA Single crystal spectroscopy (UV-Vis, fluorescence and Raman)
X06SA Beamline features (http://www.psi.ch/sls/pxi/pxi)
- Undulator beamline with flux of 2x10^12 photons/sec at 12.4 keV (1Å) and fully tunable from 6.0 to 17.5 keV (2.07 - 0.71 Å)
- Focused beam size and divergency: HRD - 85x10 microns and 0.35x0.06 mrad; MD2 - 25x5 microns and 0.5x0.4 mrad
- PILATUS 6M pixel detector at the High Resolution Diffractometer, allowing continuous, fine phi-sliced data acquisition (25 frames per second) with 20 bit dynamic range (see http://pilatus.web.psi.ch/ or www.dectris.com for further information)
- MAR225 CCD at Micro-Diffractometer MD2, allowing data collection with a focussed beam size of 25 x 5 micrometers, and smaller beam size with triple-aperture assembly ( 5 x 5, 10 x 10, 20 x 20 micrometer).
X06DA Beamline features (http://www.psi.ch/sls/pxiii/pxiii)
- Super-bending magnet beamline with flux of 5x10¹¹ photons/sec at 12.4 keV (1Å) and fully tunable from 6.0 to 17.5 keV (2.07 - 0.71 Å)
- Focused beam size and divergency: 80x45 microns and 2x0.5 mrad (with possibility to reduce horizontal divergency to 0.4 mrad)
- Mini-hutch design for fast manual mounting
- MAR225 CCD detector, PILATUS 2M (60 Hz, 450 um Si sensor) from Nov. 2011
- In-situ X-ray diffraction screening (with any SBS format plate) available during users shifts (R. Bingel-Erlenmeyer, et al., Crystal Growth & Design 2011, 11, 916)
X10SA Beamline features (http://www.psi.ch/sls/pxii/pxii)
- Undulator beamline with flux of 2x10^12 photons/sec at 12.4 keV (1Å) and fully tunable from 6.0 to 20 keV (2.07 - 0.62 Å)
- Focused beam size and divergency: 50x10 microns and 0.6x0.1 mrad
- In-situ on-axis single crystal UV-Vis, fluorescence, Raman and Resonance Raman microspectrophotometer (http://www.psi.ch/sls/pxii/spectrolab)
- PILATUS 6M pixel detector
Best regards,
The MX group at SLS
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